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JCMsuite Applications in R&D
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2017
2017
Metrology of nanoscale grating structures by UV scatterometry
Tagged under
optical metrology and sensing
light scattering computation
optimization and parameter retrieval methods
Investigating surface structures by EUV scattering
Tagged under
optical metrology and sensing
optical and EUV lithography
advanced finite element methods
optimization and parameter retrieval methods
uncertainty quantification methods
Light management by nanostructures in chalcopyrite solar cells
Tagged under
photovoltaics
light scattering computation
Whispering gallery mode lasers for sensing applications
Tagged under
light sources
optical metrology and sensing
optical resonators and antennas
resonance mode computation
High harmonic generation in corrugated micrometer-scale waveguides
Tagged under
nonlinear optics
light scattering computation
Evaluating the effects of modeling errors for isolated finite three-dimensional targets
Tagged under
optical metrology and sensing
optical and EUV lithography
advanced finite element methods
optimization and parameter retrieval methods
Quantifying parameter uncertainties in optical scatterometry using Bayesian inversion
Tagged under
optical metrology and sensing
other fields
advanced finite element methods
optimization and parameter retrieval methods
uncertainty quantification methods
light scattering computation
Efficient single-photon source based on a deterministically fabricated single quantum dot microstructure with backside gold mirror
Tagged under
quantum optics
light sources
advanced finite element methods
FEM for validation of alternative scattering computation method
Tagged under
optical metrology and sensing
optical and EUV lithography
other fields
software benchmarks
light scattering computation
Enhanced Directional Emission from Monolayer WSe2 Integrated onto a Multiresonant Silicon-Based Photonic Structure
Tagged under
light sources
quantum optics
photonic crystals
integrated optics
metamaterials
light scattering computation
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JCMsuite Applications in R&D
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